3–7 Sept 2018
NOVA School of Science and Technology (FCT NOVA)
Europe/Lisbon timezone
19th International Conference Physics of Highly Charged Ions

Measurement of Surface Wakefield Intensity for 1s3s 3S1 state in He-like Ti

Not scheduled
15m
NOVA School of Science and Technology (FCT NOVA)

NOVA School of Science and Technology (FCT NOVA)

Faculdade de Ciências e Tecnologia 2829-516 Caparica Portugal
Poster

Speakers

gaurav sharma (Delhi Technological University, New Delhi, India)Mr Sarvesh Kumar (3Cefitec, Department of Physics, Faculdade de Ciencias e Tenologia,Universidade NOVA de Lisboa, Portugal)

Keywords

Beam-foil spectroscopy, stark mixing, time-of-flight measurement,

Topics Fundamental Aspects, Structure and Spectroscopy

Primary authors

gaurav sharma (Delhi Technological University, New Delhi, India) TAPAN Nandi (IUAC, JNU CAMPUS, NEW DELHI) Dr nitin K puri (delhi technological University) Mr Sarvesh Kumar (3Cefitec, Department of Physics, Faculdade de Ciencias e Tenologia,Universidade NOVA de Lisboa, Portugal)

Presentation materials

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