HCI 2018

Name: HCI 2018
Start: 2018-09-03T09:00:00+01:00
End: 2018-09-07T14:00:00+01:00
Location: NOVA School of Science and Technology (FCT NOVA)

3–7 Sept 2018

NOVA School of Science and Technology (FCT NOVA)

Europe/Lisbon timezone

19th International Conference Physics of Highly Charged Ions

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Enhanced Ar-K X-ray Emission Observed in EBIT at Electron Energies around 6500 eV

Not scheduled

15m

NOVA School of Science and Technology (FCT NOVA)

Faculdade de Ciências e Tecnologia 2829-516 Caparica Portugal

Poster

Ms Weronika Biela (Jagiellonian University)

Keywords

Electron Beam Ion Trap,
EBIT,
dielectronic recombination,
trielectronic radiative recombination

Topics	Collisions with Electrons, Ions, Atoms and Molecules

Ms Weronika Biela (Jagiellonian University) Prof. Andrzej Warczak (Jagiellonian University)

Mr Adam Mucha (Jagiellonian University) Mr Adam Malarz (Jagiellonian University)

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HCI 2018

Enhanced Ar-K X-ray Emission Observed in EBIT at Electron Energies around 6500 eV

NOVA School of Science and Technology (FCT NOVA)

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