3–7 Sept 2018
NOVA School of Science and Technology (FCT NOVA)
Europe/Lisbon timezone
19th International Conference Physics of Highly Charged Ions

Overview of the HCI Spectroscopy Program at the NIST Electron Beam Ion Trap

Not scheduled
15m
NOVA School of Science and Technology (FCT NOVA)

NOVA School of Science and Technology (FCT NOVA)

Faculdade de Ciências e Tecnologia 2829-516 Caparica Portugal
Poster

Speaker

Yuri Ralchenko (NIST)

Keywords

EBIT
Mid- and high-Z elements
EUV and x-ray spectra
Collisional-radiative modeling

Topics Fundamental Aspects, Structure and Spectroscopy

Primary authors

Yuri Ralchenko (NIST) Dr Dipti (National Institute of Standards and Technology ) Alexander Borovik (Justus-Liebig-Universität Gießen) Dr Joan Dreiling (National Institute of Standards and Technology) Amy Gall (Clemson University) Dr John Gillaspy (National Science Foundation) Deirdre Kilbane (Univ College Dublin) Aung Sis Naing (University of Delaware / NIST) Dr Eric Norrgard (National Institute of Standards & Technology) Dmitry Osin (TAE Technologies) Yuri Podpaly (LLNL) Joseph Reader (NIST) Samuel Sanders (Clemson University) Angela Small (University of Maryland at College Park) Endre Takacs (Clemson University / NIST) Joseph Tan (National Institute of Standards and Technology)

Presentation materials

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