HCI 2018

Name: HCI 2018
Start: 2018-09-03T09:00:00+01:00
End: 2018-09-07T14:00:00+01:00
Location: NOVA School of Science and Technology (FCT NOVA)

3–7 Sept 2018

NOVA School of Science and Technology (FCT NOVA)

Europe/Lisbon timezone

19th International Conference Physics of Highly Charged Ions

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SIM-X: Silicon Microcalorimeters For X-ray Spectroscopy At Storage Rings – Status And Perspectives

Not scheduled

15m

NOVA School of Science and Technology (FCT NOVA)

Faculdade de Ciências e Tecnologia 2829-516 Caparica Portugal

Poster

Mr Pascal Scholz (Justus-Liebig-University Giessen)

Keywords

X-ray spectroscopy, Silicon microcalorimeters

Topics	Production, Experimental Developments and Applications

Mr Pascal Scholz (Justus-Liebig-University Giessen)

Dr Victor Andrianov (Lomonosov Moscow State University) Mr Alexander Bleile (GSI Helmholtz Center) Dr Artur Echler (Johannes-Gutenberg University Mainz) Prof. Peter Egelhof (Johannes-Gutenberg University Mainz) Mr Damian Müll (Justus-Liebig-University Giessen) Saskia Kraft-Bermuth (Justus-Liebig-University Giessen)

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HCI 2018

SIM-X: Silicon Microcalorimeters For X-ray Spectroscopy At Storage Rings – Status And Perspectives

NOVA School of Science and Technology (FCT NOVA)

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