HCI 2018

Name: HCI 2018
Start: 2018-09-03T09:00:00+01:00
End: 2018-09-07T14:00:00+01:00
Location: NOVA School of Science and Technology (FCT NOVA)

3–7 Sept 2018

NOVA School of Science and Technology (FCT NOVA)

Europe/Lisbon timezone

19th International Conference Physics of Highly Charged Ions

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A Dual-Anode Miniature Electron Beam Ion Trap to Produce and Extract Highly-Charged Ions with Low Ionization Threshold

Not scheduled

15m

NOVA School of Science and Technology (FCT NOVA)

Faculdade de Ciências e Tecnologia 2829-516 Caparica Portugal

Poster

Aung Sis Naing (University of Delaware / NIST)

Keywords

mini-EBIT
HCI
permanent magnet ion trap
ion trap
spectroscopy
EBIT

Topics	Production, Experimental Developments and Applications

Aung Sis Naing (University of Delaware / NIST) Joseph Tan (National Institute of Standards and Technology)

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HCI 2018

A Dual-Anode Miniature Electron Beam Ion Trap to Produce and Extract Highly-Charged Ions with Low Ionization Threshold

NOVA School of Science and Technology (FCT NOVA)

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