3–7 Sept 2018
NOVA School of Science and Technology (FCT NOVA)
Europe/Lisbon timezone
19th International Conference Physics of Highly Charged Ions

Experiments with Multiply-Charged Lanthanide Ions in the NIST EBIT

Not scheduled
15m
NOVA School of Science and Technology (FCT NOVA)

NOVA School of Science and Technology (FCT NOVA)

Faculdade de Ciências e Tecnologia 2829-516 Caparica Portugal
Poster

Speaker

Joseph Tan (National Institute of Standards and Technology)

Keywords

Spectroscopy
EBIT
EUV
HCI
lanthanide

Topics Fundamental Aspects, Structure and Spectroscopy

Primary authors

Joseph Tan (National Institute of Standards and Technology) Aung Sis Naing (University of Delaware / NIST) Dr Eric Norrgard (National Institute of Standards & Technology) Angela Small (University of Maryland at College Park) Samuel Sanders (Clemson University) Roshani Silwal (Clemson University) Endre Takacs (Clemson University / NIST) Yuri Ralchenko (National Institute of Standards & Technology)

Presentation materials

There are no materials yet.